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Re: FI pattern in component test
Posted to Snap-on Handheld Users Group on 4/30/2003

Dave, look into a low amps probe. The vantage is a very powerful tool as you have seen, but consider enhancing it with the probe. Current ramping is the cutting edge of this whole thing and also completes the equation for what is happening in the circut. Seein... Login to read more.